Chinese Journal of Quantum Electronics, Volume. 18, Issue 5, 462(2001)
Electron Reflection at Interface in Superlattice and Induced Photocu rrentCharacteristics
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Electron Reflection at Interface in Superlattice and Induced Photocu rrentCharacteristics[J]. Chinese Journal of Quantum Electronics, 2001, 18(5): 462
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