Acta Photonica Sinica, Volume. 36, Issue 11, 2053(2007)

The Application of Genetic Algorithm in Thin Film Characters Measurement

[in Chinese]... [in Chinese], [in Chinese] and [in Chinese] |Show fewer author(s)
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    References(2)

    [1] [1] LAAZIZA Y,BENNOUNA A,CHADBOURN N.Optical characterization of low optical thickness thin films from transmittance and back reflectance measurements[J].Thin Solid Films,2000,372(5):149-155.

    [3] [3] CHEN Yan-ping,LIU Yu-ling,LIU Peng,et al.Determining thin film thickness characterization using adaptive simulated annealing algorithm[C].SPIE,2006,6024:16.

    CLP Journals

    [1] ZHAI Zi-yu, YE Mei-ying. A Coating Design Method Based on Particle Swarm Optimization[J]. Acta Photonica Sinica, 2011, 40(9): 1338

    [2] CHU Dong, GONG Xing-zhi, CHENG Liang, YU Fei-hong. Multilayer Film Thickness Measurement Based on Genetic Simulated Annealing Algorithm[J]. Opto-Electronic Engineering, 2010, 37(2): 45

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. The Application of Genetic Algorithm in Thin Film Characters Measurement[J]. Acta Photonica Sinica, 2007, 36(11): 2053

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    Paper Information

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    Received: Jun. 12, 2006

    Accepted: --

    Published Online: Jul. 8, 2008

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