Particle Size Detection Technology Based on Imaging Polarization Nephelometer

Xin Pan; Zhangjun Wang; Xiangqian Meng; Xiufen Wang; Chao Chen; Wei Deng; Xingtao Liu; Hui Li; Xianxin Li; Quanfeng Zhuang

doi:10.3788/LOP57.092902

Laser & Optoelectronics Progress, Volume. 57, Issue 9, 092902(2020)

Particle Size Detection Technology Based on Imaging Polarization Nephelometer

Xin Pan, Zhangjun Wang^*, Xiangqian Meng, Xiufen Wang, Chao Chen, Wei Deng, Xingtao Liu, Hui Li, Xianxin Li, and Quanfeng Zhuang

Author Affiliations

Institute of Oceanographic Instrumentation, Shandong Academy of Sciences, Qilu University of Technology (Shandong Academy of Sciences), Qingdao, Shandong 266001, China

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Xin Pan, Zhangjun Wang, Xiangqian Meng, Xiufen Wang, Chao Chen, Wei Deng, Xingtao Liu, Hui Li, Xianxin Li, Quanfeng Zhuang. Particle Size Detection Technology Based on Imaging Polarization Nephelometer[J]. Laser & Optoelectronics Progress, 2020, 57(9): 092902

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Paper Information

Category: Scattering

Received: Sep. 6, 2019

Accepted: Sep. 16, 2019

Published Online: May. 6, 2020

The Author Email: Wang Zhangjun (zhangjun.wang@hotmail.com)

DOI:10.3788/LOP57.092902

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology