Journal of Inorganic Materials, Volume. 36, Issue 2, 197(2021)
Figures & Tables(7)
. Low magnification SEM images of the micro-interfaces in the as-prepared co-sintered sample for screening of the barrier layer materials (a) Cr, Fe, Co, Ti; (b) Al, Zr
. Surface mapping of the micro-interfaces between P-BT matrix and 6 barrier layer candidate particles aged at 300 ℃ for 2 d
. (a) Interfacial microstructure of the as-prepared Fe/P-BT TE element before aging and (b) line scanning of the as-prepared Fe/P-BT interface
. Cross sectional microstructures of the Fe/P-BT interface after aging at different temperatures for different time
. (a) Variation of the diffusion layer thickness at the Fe/P-BT interface with the square root of aging time at 300, 325 and 350 ℃, and (b) variation of lnD with 1000/T between 300 and 350 ℃
. Evolution of the Fe/P-BT interfacial resistivity with aging time at 350 ℃
Table 1.
Fitting results of the growth rates of the diffusion layers, the relationship between diffusion layer thickness and aging time, and predicted service lives of the Fe/P-BT element at different temperatures
View tableView in ArticleTable 1.
Fitting results of the growth rates of the diffusion layers, the relationship between diffusion layer thickness and aging time, and predicted service lives of the Fe/P-BT element at different temperatures
Temperature/ ℃ D/(×10-18, m2∙s-1) (Y-Y0)/μm Predicted service life*/d 300 7.29 2.7×10-3t0.5 428 325 65.1 8.1×10-3t0.5 52 350 203.1 14.3×10-3t0.5 16
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Xu WANG, Ming GU, Jincheng LIAO, Qingfeng SONG, Xun SHI, Shengqiang BAI, Lidong CHEN.
Paper Information
Category: RESEARCH LETTERS
Received: Mar. 10, 2020
Accepted: --
Published Online: Nov. 24, 2021
The Author Email: BAI Shengqiang (bsq@mail.sic.ac.cn)
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