Optics and Precision Engineering, Volume. 15, Issue 9, 1398(2007)

Curvature measurement of micro cantilever based on phase-stepping microscopic interferometry

[in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]2, and [in Chinese]1
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    References(4)

    [4] [4] CHEN K S,OU K S.Modification of curvature-based thin-film residual stress measurement for MEMS applications[J].Journal of Micromechanics and Microengineering,2002,12:917-924.

    [6] [6] JENSEN B D,DEBOER M P,MASTERS N D,et al..Interferometry of actuated microcantilevers to determine material properties and test structure nonidealities in MEMS[J].Journal of MicroElectroMechanical Systems,2001,10 (3):336-346.

    [7] [7] BAKER M S,DEBOER M P,SMITH N F,etal..Integrated measurement-modeling approaches for evaluating residual stress using micromachined fixed-fixed beams[J].Journal of MicroElectroMechanical Systems,2002,11(6):743-753.

    [13] [13] GUO T,HU CH G,HU X D,etal..Stroboscopic phase-shifting interferometry for dynamic MEMS character-ization[C].Proceedings of the Fourth International Workshop on Micro factories,Shanghai,P.R.China:IWMF,2004:622-627.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Curvature measurement of micro cantilever based on phase-stepping microscopic interferometry[J]. Optics and Precision Engineering, 2007, 15(9): 1398

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    Paper Information

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    Received: Dec. 29, 2006

    Accepted: --

    Published Online: Feb. 18, 2008

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