High Power Laser and Particle Beams, Volume. 32, Issue 7, 075001(2020)

Influence of nitrogen ion implantation on surface charge accumulation and dissipation of polytetrafluoroethylene

Chang Liu1...2, Falun Song1,*, Mingdong Zhu1,3, Chunxia Li1, Beizhen Zhang1, Fei Li1, Ganping Wang1, Haitao Gong1, Yanqing Gan1 and Xiao Jin1 |Show fewer author(s)
Author Affiliations
  • 1Science and Technology on High Power Microwave Laboratory, Institute of Applied Electronics, China Academy of Engineering Physics, Mianyang 621900, China
  • 2Graduate School of China Academy of Engineering Physics, Beijing 100088, China
  • 3China State Key Laboratory of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China
  • show less
    Figures & Tables(13)
    Plasma immersion ion implantation system
    Surface potential measurement system
    XPS energy spectra of PTFE samples at different RF power and different processing time
    XPS energy spectrum of element C of some PTFE samples
    XPS energy spectra of element N of some PTFE samples
    FTIR spectra of PTFE samples under different RF power and processing time
    Relationship between water contact angle of PTFE sample surface,RF power,and processing time
    Relationship between surface resistivity of PTFE samples and RF power and processing time
    Decay curve of surface central potential with time for PTFE samples under different RF power and processing time
    Normalized decay curve of surface center potential of PTFE samples with different RF power and processing time
    Distribution curve of trap level on PTFE sample surface under different RF power and processing time
    • Table 1. Proportion of content of element C in PTFE sample surface before and after ion implantation

      View table
      View in Article

      Table 1. Proportion of content of element C in PTFE sample surface before and after ion implantation

      RF power/Wprocessing time/hproportion/%
      CC=OCFCF2CF3
      0031.18.41.458.20.8
      200132.25.31.559.51.6
      200217.45.32.172.92.2
      400216.65.02.169.56.7
    • Table 2. Energy level and density of traps on the surface of PTFE samples under different RF power and processing time

      View table
      View in Article

      Table 2. Energy level and density of traps on the surface of PTFE samples under different RF power and processing time

      RF power/Wprocessing time/hsurface trap level/eVsurface trap density/(1020eV−1·m−3
      000.7569.82
      20010.7549.19
      20020.7558.56
      40020.7357.04
    Tools

    Get Citation

    Copy Citation Text

    Chang Liu, Falun Song, Mingdong Zhu, Chunxia Li, Beizhen Zhang, Fei Li, Ganping Wang, Haitao Gong, Yanqing Gan, Xiao Jin. Influence of nitrogen ion implantation on surface charge accumulation and dissipation of polytetrafluoroethylene[J]. High Power Laser and Particle Beams, 2020, 32(7): 075001

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Pulsed Power Technology

    Received: Feb. 25, 2020

    Accepted: --

    Published Online: Jul. 10, 2020

    The Author Email: Song Falun (songfalun@caep.cn)

    DOI:10.11884/HPLPB202032.200045

    Topics