Journal of Inorganic Materials, Volume. 38, Issue 4, 387(2023)

Double Dielectric Layer Metal-oxide Memristor: Design and Applications

Junqi YOU1... Ce LI1, Dongliang YANG1, and Linfeng SUN12,* |Show fewer author(s)
Author Affiliations
  • 11. MOE Key Laboratory of Advanced Optoetectronic Quantum Architecture and Measurement, School of Physics, Beijing Institute of Technology, Beijing 100081, China
  • 22. Yangtze Delta Region Academy of Beijing Institute of Technology, Jiaxing 314019, China
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    Memristor, fusing the functions of storage and computing within a single device, is one of the core electronic components to solve the bottleneck of von Neumann architecture. With the unique volatile/non-volatile resistive switching characteristic, memristor can simulate the function of synapses/neurons in brain well. In addition, due to the compatibility with traditional complementary metal-oxide-semiconductor (CMOS) processes, metal-oxide-based memristors have received a lot of attention. In recent years, many kinds of metal-oxide memristors based on single dielectric layer have been proposed. However, there are still some problems such as the instability of switching voltage, fluctuation of high/low resistance state and poor endurance of memristive device. Thus, the researchers have successfully optimized the device performance by introducing the double dielectric layer into the metal-oxide memristors. In this article, we introduce the advantages of double dielectric layers-based metal-oxide memristors, and discuss their mechanism and design of double dielectric layers-based metal-oxide memristors. Eventually, we introduce their potential applications in neuromorphic computing. This review provides some enlightenment on how to design high-performance metal-oxide memristor based on double dielectric layers.

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    Junqi YOU, Ce LI, Dongliang YANG, Linfeng SUN. Double Dielectric Layer Metal-oxide Memristor: Design and Applications[J]. Journal of Inorganic Materials, 2023, 38(4): 387

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    Paper Information

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    Received: Dec. 19, 2022

    Accepted: --

    Published Online: Oct. 17, 2023

    The Author Email: SUN Linfeng (sunlinfeng@bit.edu.cn)

    DOI:10.15541/jim20220760

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