Opto-Electronic Engineering, Volume. 41, Issue 2, 88(2014)

The Theoretical Analysis of Thermal Infrared Emission Polarization and Experimental Verification

NIU Jiyong1...2,*, LI Fanming1,2, and MA Lixiang12 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
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    References(6)

    [1] [1] Oscar Sandus. A Review of Emission Polarization [J]. Applied Optics(S0003-6935),1965,4(12): 1634-1642.

    [2] [2] Lawrence B Woff,Andrew Lundberg,Renjie Tang. Image understanding from thermal emission polarization [C]// IEEE Conference on Computer Vision and Pattern Recognition,Santa Barbara,C A,Jun 23-25,1998: 625-631.

    [3] [3] Kristan P Gurton,Rachid Dahmani. Effect of surface roughness and complex indices of refraction on polarized thermal emission [J]. Applied Optic(S0003-6935),2005,44(26): 5361-5367.

    [4] [4] Jordan D L,Lewis G. Measurement of the effect of surface roughness on the polarization state of thermally emitted radiation [J]. Optics Letters(S0146-9592),1994,19(10): 692-694.

    [5] [5] Robert B Reid,Mark E Oxley,Michael T Eismann,et al. Quantifying Surface Normal Estimation [J]. Proceeding of SPIE(S0277-786X),2006,6240: 01-11.

    [7] [7] Aristide Dogariu, Boreman G D. Rough-surface polarization effects of infrared emission [J]. Proceeding of SPIE(S0277-786X),1996,2828: 162-170.

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    NIU Jiyong, LI Fanming, MA Lixiang. The Theoretical Analysis of Thermal Infrared Emission Polarization and Experimental Verification[J]. Opto-Electronic Engineering, 2014, 41(2): 88

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    Paper Information

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    Received: Aug. 20, 2013

    Accepted: --

    Published Online: Feb. 26, 2014

    The Author Email: Jiyong NIU (njy123@mail.ustc.edu.cn)

    DOI:10.3969/j.issn.1003-501x.2014.02.014

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