Learning-based super-resolution interpolation for sub-Nyquist sampled laser speckles

Huanhao Li; Zhipeng Yu; Qi Zhao; Yunqi Luo; Shengfu Cheng; Tianting Zhong; Chi Man Woo; Honglin Liu; Lihong V. Wang; Yuanjin Zheng; Puxiang Lai

doi:10.1364/PRJ.472512

Photonics Research, Volume. 11, Issue 4, 631(2023)

Learning-based super-resolution interpolation for sub-Nyquist sampled laser speckles

Huanhao Li^1,2、†, Zhipeng Yu^1,2、†, Qi Zhao^1,2、†, Yunqi Luo³, Shengfu Cheng^1,2, Tianting Zhong^1,2, Chi Man Woo^1,2, Honglin Liu^1,4, Lihong V. Wang^5,7、*, Yuanjin Zheng^3,8、*, and Puxiang Lai^1,2,6,9、*

Author Affiliations

¹Department of Biomedical Engineering, Hong Kong Polytechnic University, Hong Kong, China

²Hong Kong Polytechnic University Shenzhen Research Institute, Shenzhen 518063, China

³School of Electrical and Electronics Engineering, Nanyang Technological University, Singapore 639798, Singapore

⁴Key Laboratory for Quantum Optics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

⁵Caltech Optical Imaging Laboratory, Andrew and Peggy Cherng Department of Medical Engineering, California Institute of Technology, Pasadena, California 91125, USA

⁶Photonics Research Institute, Hong Kong Polytechnic University, Hong Kong, China

⁷e-mail: LVW@caltech.edu

⁸e-mail: yjzheng@ntu.edu.sg

⁹e-mail: puxiang.lai@polyu.edu.hk

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Huanhao Li, Zhipeng Yu, Qi Zhao, Yunqi Luo, Shengfu Cheng, Tianting Zhong, Chi Man Woo, Honglin Liu, Lihong V. Wang, Yuanjin Zheng, Puxiang Lai. Learning-based super-resolution interpolation for sub-Nyquist sampled laser speckles[J]. Photonics Research, 2023, 11(4): 631

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Paper Information

Category: Image Processing and Image Analysis

Received: Aug. 15, 2022

Accepted: Nov. 6, 2022

Published Online: Mar. 29, 2023

The Author Email: Lihong V. Wang (LVW@caltech.edu), Yuanjin Zheng (yjzheng@ntu.edu.sg), Puxiang Lai (puxiang.lai@polyu.edu.hk)

DOI:10.1364/PRJ.472512

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology