Chinese Optics Letters, Volume. 14, Issue 1, 012301(2016)

Electro-optic effects induced by the built-in electric field in a {001}-cut silicon crystal

Qi Wang1, Zhang Hai1, Nian Liu1, Baijun Zhao4, Xiuhuan Liu2、**, Lixin Hou3, Yanjun Gao1, Gang Jia1, and Zhanguo Chen1、*
Author Affiliations
  • 1State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
  • 2College of Communication Engineering, Jilin University, Changchun 130012, China
  • 3College of Information Technology, Jilin Agricultural University, Changchun 130118, China
  • 4Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, China
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    Figures & Tables(4)
    Configuration of silicon sample and the measurement system for EFI PE. (a) MISIM configuration of silicon sample whose size is denoted. (b) Experimental measurement system for EFI PE.
    Dependence of the electro-optic signal on the AC applied voltage for silicon sample with MISIM capacitor structure. The electro-optic response is linear with the applied voltage up to 140 V. The experimental curve is obtained without the external DC bias, so the linear electro-optic signal is induced by the built-in field in the SCR of the silicon sample. The insert figure is the measured Kerr signal.
    Configuration of silicon sample and the measurement system for EFI OR. (a) MSM configuration of silicon sample. (b) The experimental system for measuring EFI OR. A half-wave plate is used to change the azimuth of the linearly polarized light.
    Measured anisotropy of EFI OR in the SCR of the (001) surface layer of silicon crystal.
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    Qi Wang, Zhang Hai, Nian Liu, Baijun Zhao, Xiuhuan Liu, Lixin Hou, Yanjun Gao, Gang Jia, Zhanguo Chen. Electro-optic effects induced by the built-in electric field in a {001}-cut silicon crystal[J]. Chinese Optics Letters, 2016, 14(1): 012301

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    Paper Information

    Category: Optical devices

    Received: Jul. 6, 2015

    Accepted: Nov. 6, 2015

    Published Online: Aug. 6, 2018

    The Author Email: Xiuhuan Liu (xhliu@jlu.edu.cn), Zhanguo Chen (czg@jlu.edu.cn)

    DOI:10.3788/COL201614.012301

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