Acta Photonica Sinica, Volume. 34, Issue 5, 710(2005)

Three Half-wave Filter and Analysis of Layer Thickness

[in Chinese], [in Chinese], and [in Chinese]
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    References(1)

    [3] [3] Macleod H A.Error compensation mechanisms in some thin-film monitoring systems.Optica Acta,1977,24(9):907~930

    CLP Journals

    [1] Cai Yuan, Liu Dingquan, Luo Haihan. Design and Fabrication of 3.5~4.0 μm Band-Pass Filter Working at Cryogenic Temperature[J]. Chinese Journal of Lasers, 2012, 39(1): 107001

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    [in Chinese], [in Chinese], [in Chinese]. Three Half-wave Filter and Analysis of Layer Thickness[J]. Acta Photonica Sinica, 2005, 34(5): 710

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    Paper Information

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    Received: Mar. 17, 2004

    Accepted: --

    Published Online: Jun. 12, 2006

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