Opto-Electronic Engineering, Volume. 32, Issue 4, 32(2005)
[in Chinese]
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[6] [6] Akira ISHIDA.Apparatus for measuring straightness [P].US Patent:5333053,1994-07-26.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(4): 32
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