Electro-Optic Technology Application, Volume. 26, Issue 5, 68(2011)
Micro-resistance Measuring System of Low Measuring Current
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AN Ying, HU Juan. Micro-resistance Measuring System of Low Measuring Current[J]. Electro-Optic Technology Application, 2011, 26(5): 68
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Received: Sep. 9, 2011
Accepted: --
Published Online: Nov. 11, 2011
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CSTR:32186.14.
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