Acta Optica Sinica, Volume. 39, Issue 10, 1034002(2019)

Soft X-Ray Absorption Spectroscopy of Low Z Element Based on Fluorescence Emission

Junqin Li1,2, Zhenhua Chen1,2, Zilong Zhao1,2, Ying Zou1,2、*, Yong Wang1,2、**, and Renzhong Tai1,2、***
Author Affiliations
  • 1Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Shanghai Synchrotron Radiation Facility, Zhangjiang Laboratory, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
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    References(16)

    [1] Wang Q W, Liu W H[M]. X-ray absorption fine structure and its application, 52-139(1994).

    [3] Uo M, Asakura K, Yokoyama A et al. Analysis of titanium dental implants surrounding soft tissue using X-ray absorption fine structure (XAFS) analysis[J]. Chemistry Letters, 34, 776-777(2005).

    [16] Hitchcock A P, Mancini D C. Bibliography, Related Phenomena. 67(1): vii(1994).

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    Junqin Li, Zhenhua Chen, Zilong Zhao, Ying Zou, Yong Wang, Renzhong Tai. Soft X-Ray Absorption Spectroscopy of Low Z Element Based on Fluorescence Emission[J]. Acta Optica Sinica, 2019, 39(10): 1034002

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    Paper Information

    Category: X-Ray Optics

    Received: Apr. 16, 2019

    Accepted: Jun. 24, 2019

    Published Online: Oct. 9, 2019

    The Author Email: Zou Ying (zouying@zjlab.org.cn), Wang Yong (wangyong@zjlab.org.cn), Tai Renzhong (tairenzhong@zjlab.org.cn)

    DOI:10.3788/AOS201939.1034002

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