Acta Optica Sinica, Volume. 39, Issue 10, 1034002(2019)
Soft X-Ray Absorption Spectroscopy of Low Z Element Based on Fluorescence Emission
We establish a measurement system based on low atomic number absorption spectrum of fluorescence emission via the beamline station 08U1A of Shanghai Synchrotron Radiation Source, and explore the partial fluorescence yield (PFY) based on absorption method. The feasibility and applicability of this setup is verified on low Z elements in soft condensed matter and semiconductor areas. The research objects of CF4 gas and iodine methylamine lead (CH3NH3PbI3) verify the feasibility of PFY absorption spectroscopy. Then the low limit of sensitivity to sample concentration is determined.
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Junqin Li, Zhenhua Chen, Zilong Zhao, Ying Zou, Yong Wang, Renzhong Tai. Soft X-Ray Absorption Spectroscopy of Low Z Element Based on Fluorescence Emission[J]. Acta Optica Sinica, 2019, 39(10): 1034002
Category: X-Ray Optics
Received: Apr. 16, 2019
Accepted: Jun. 24, 2019
Published Online: Oct. 9, 2019
The Author Email: Zou Ying (zouying@zjlab.org.cn), Wang Yong (wangyong@zjlab.org.cn), Tai Renzhong (tairenzhong@zjlab.org.cn)