Acta Optica Sinica, Volume. 7, Issue 9, 838(1987)

Determination of refractive index and thickness of a low index thin film by leaky waveguide technique

WU QIHONG
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    WU QIHONG. Determination of refractive index and thickness of a low index thin film by leaky waveguide technique[J]. Acta Optica Sinica, 1987, 7(9): 838

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Nov. 27, 1986

    Accepted: --

    Published Online: Sep. 20, 2011

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