Infrared and Laser Engineering, Volume. 44, Issue 7, 2050(2015)

Quantitative identification of coating thickness and debonding defects of TBC by pulse phase technology

Chen Lin, Yang Li, Fan Chunli, Shi Hongchen, and Zhao Xiaolong
Author Affiliations
  • [in Chinese]
  • show less
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    Chen Lin, Yang Li, Fan Chunli, Shi Hongchen, Zhao Xiaolong. Quantitative identification of coating thickness and debonding defects of TBC by pulse phase technology[J]. Infrared and Laser Engineering, 2015, 44(7): 2050

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: 红外技术及应用

    Received: Nov. 11, 2014

    Accepted: Dec. 17, 2014

    Published Online: Jan. 26, 2016

    The Author Email:

    DOI:

    Topics