Laser & Optoelectronics Progress, Volume. 58, Issue 4, 0411002(2021)

Depth Detection of Material Surface Defects Based on Laser Thermography

Jiaqi Liu1, Zhijie Zhang1、*, Zhenyu Lin1, and Wuliang Yin1,2
Author Affiliations
  • 1Key Laboratory of Instrumentation Science & Dynamic Measurement of Ministry of Education, North University of China, Taiyuan,Shanxi 0 38507, China;
  • 2School of Electrical and Electronic Engineering, University of Manchester, Manchester M139PL, UK
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    Figures & Tables(11)
    Schematic of laser heating
    Schematic of proposed system
    Schematic of material characteristics
    Infrared images of defects
    Change of gray value at different defects. (a) No. 5 defect; (b) No. 10 defect; (c) No. 15 defect
    Relationship between temperature and defect depth
    Fitting curve between temperature of point B and defect depth when temperature of point A is 322.15 K
    • Table 1. Change of gray value and temperature of point B

      View table

      Table 1. Change of gray value and temperature of point B

      Defect depth /mmGray valueTemperature /K
      0.13124320.20
      0.26119317.60
      0.39117316.50
      0.52112313.70
      0.65110312.60
      0.78109312.00
      0.91108311.40
      1.04108311.40
      1.17106310.30
      1.30105309.65
      1.43103308.50
      1.56100306.70
      1.6998305.05
      1.8298305.05
      1.9596304.50
      2.0890300.85
      2.2189299.85
      2.3487298.50
      2.4783295.83
    • Table 2. Parameters of fitting equations

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      Table 2. Parameters of fitting equations

      Fitting curveFitting equationSSERMSE
      Exponential equationTB=345-26.28exp(0.25ddepth)19.791.112
      Linear equationTB=320.1-8.97ddepth23.741.18
      Quadratic equationTB =-0.93ddepth 2-6.56ddepth +31920.421.13
    • Table 3. Residuals between fitting equation and measured data

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      Table 3. Residuals between fitting equation and measured data

      Defect depth /mm0.130.260.390.520.650.780.911.041.171.30
      e0.220.210.130.200.240.190.140.010.030.02
      Defect depth /mm1.431.561.691.721.952.082.212.342.47
      e0.010.040.040.080.090.100.020.010.05
    • Table 4. Parameters of fitting equations

      View table

      Table 4. Parameters of fitting equations

      Various parameters of fitting curve when temperature of A is 320.15 K
      Fitting curveFitting equationSSERMSE
      Exponential equationTB=321.7-3.81exp(0.51ddepth)4.530.53
      Linear equationTB=318.9-3.88ddepth7.940.68
      Quadratic equationTB =-0.89ddepth 2-1.56ddepth +317.94.850.55
      Various parameters of fitting curve when temperature of A is 317.15 K
      Fitting curveFitting equationSSERMSE
      Exponential equationTB=321.8-6.45exp(0.33ddepth)4.250.51
      Linear equationTB=316-3.29ddepth5.610.57
      Quadratic equationTB =-0.58ddepth 2-1.77ddepth +315.34.270.52
      Various parameters of fitting curvewhen temperature of A is 314.15 K
      Fitting curveFitting equationSSERMSE
      Exponential equationTB=317-4.33exp(0.39ddepth)3.960.49
      Linear equationTB=313.3-2.91ddepth4.210.50
      Quadratic equationTB =-0.26ddepth 2-2.23ddepth+3133.980.50
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    Jiaqi Liu, Zhijie Zhang, Zhenyu Lin, Wuliang Yin. Depth Detection of Material Surface Defects Based on Laser Thermography[J]. Laser & Optoelectronics Progress, 2021, 58(4): 0411002

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    Paper Information

    Category: Imaging Systems

    Received: Jul. 4, 2020

    Accepted: Aug. 6, 2020

    Published Online: Feb. 24, 2021

    The Author Email: Zhang Zhijie (zhangzhijie@nuc.edu.cn)

    DOI:10.3788/LOP202158.0411002

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