Infrared and Laser Engineering, Volume. 46, Issue 9, 917001(2017)
Review of fringe-projection profilometry and phase measuring deflectometry
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Liu Dong, Yan Tianliang, Wang Daodang, Yang Yongying, Huang Wei. Review of fringe-projection profilometry and phase measuring deflectometry[J]. Infrared and Laser Engineering, 2017, 46(9): 917001
Paper Information
Category: 光电测量
Received: Jan. 10, 2017
Accepted: Feb. 20, 2017
Published Online: Nov. 17, 2017
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