Infrared and Laser Engineering, Volume. 46, Issue 9, 917001(2017)

Review of fringe-projection profilometry and phase measuring deflectometry

Liu Dong1, Yan Tianliang1, Wang Daodang2, Yang Yongying1, and Huang Wei3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    Fringe-projection profilometry and phase measuring deflectometry can realize high accurate measurement of three-dimensional shape, which has good development prospect in the full field three-dimensional profilometry. First, the measuring principles of fringe-projection profilometry and phase measuring deflectometry were introduced. Moreover, the technologies of phase extracting and camera calibration in fringe-projection profilometry and phase measuring deflectometry were also especially emphasized, which were key technologies. Then the similarities and differences of fringe-projection profilometry and phase measuring deflectometry were compared. What′s more, the development direction and problems to be solved of enhancing the measurement accuracy and speed in fringe-projection profilometry and phase measuring deflectometry were introduced. In order to improve the measurement accuracy, main methods can be divided as follows: correcting the the Gamma effect of a digital projector and a digital camera, improving the phase extraction accuracy of the fringes, enhancing the camera calibration accuracy, phase-height/gradient calibration accuracy and other means. In order to improve the measurement speed, the phase extraction speed and the phase unwrapping speed were improved.

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    Liu Dong, Yan Tianliang, Wang Daodang, Yang Yongying, Huang Wei. Review of fringe-projection profilometry and phase measuring deflectometry[J]. Infrared and Laser Engineering, 2017, 46(9): 917001

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    Paper Information

    Category: 光电测量

    Received: Jan. 10, 2017

    Accepted: Feb. 20, 2017

    Published Online: Nov. 17, 2017

    The Author Email:

    DOI:10.3788/irla201746.0917001

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