Acta Optica Sinica, Volume. 26, Issue 8, 1167(2006)

New Method for Interferogram Fringe Pattern Analysis Based on Fourier Transform Meathod

[in Chinese]*, [in Chinese], [in Chinese], and [in Chinese]
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    References(6)

    [1] [1] W. W. Simmons. Aberrations and focusability in large solid-state laser systems[C]. Proc. SPIE, 1981, 293: 27~35

    [5] [5] P. J. Wegner, M. A. Henesian, J. T. Salmon et al.. Wavefront and divergence of the beamlet prototype laser[C]. Proc SPIE, 1999, 3492: 1019~1030

    [6] [6] A. R. Barnes, I. C.Smith. A combined phase, near field and far field diagnostic for large aperture laser systems[C]. Proc SPIE, 1999, 3492: 564~572

    [8] [8] M. Takeda, H. Ina, S. Kobayashi. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry[J]. J. Opt. Soc. Am., 1982, 72(1): 156~160

    [9] [9] J. B. Liu, P. D. Ronney. Modified Fourier transform method for interferogram fringe pattern analysis[J]. Appl. Opt., 1997, 36(25): 6231~6241

    [10] [10] J. H. Massig, J. Heppner. Fringe-pattern analysis with high accuracy by use of the Fourier-transform method: theory and experimental tests[J]. Appl. Opt., 2001, 40(13): 2081~2088

    CLP Journals

    [1] LIN Zhen-heng. A Method to Modulate Carrier-wave Speckle Pattern Fringe Based on Fringe Center[J]. Acta Photonica Sinica, 2013, 42(1): 19

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New Method for Interferogram Fringe Pattern Analysis Based on Fourier Transform Meathod[J]. Acta Optica Sinica, 2006, 26(8): 1167

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Aug. 8, 2005

    Accepted: --

    Published Online: Mar. 15, 2007

    The Author Email: (hitwyl@163.com)

    DOI:

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