Calibrating the driving voltage of each optical switch in optical switched delay line （OSDL） chips requires a multichannel optical power meter， a programmable multichannel voltage source， and other discrete instruments， which causes the problems of high cost and system complexity when the chip scale increases. In this paper， an automatic calibration and control system is proposed for OSDL chips， which includes the functions of a multichannel optical power meter and a multichannel adjustable voltage source. The power detection range is from -53 to -7.7 dBm， with an error of <0.5 dB. The voltage output range is 0-10 V， and the fluctuations are within ±0.5 mV. A microcontroller unit is used to control all parts of the system and communicate with the computer. When the driving voltages of a 5-bit OSDL chip are calibrated with the proposed system， the measured fluctuations of the transmission spectra of all 32 delay states are approximately 1 dB near 1 560 nm， and the measured delay step is 3.110 9 ps/state， which is consistent with the result of 3.062 0 ps/state obtained via calibration using commercial instruments. The proposed system achieved the same calibration and control effect as the commercial instruments and has the advantages of low cost and easy scalability. It has good application prospects.