Acta Physica Sinica, Volume. 69, Issue 2, 027802-1(2020)

Ion implantation isolation based micro-light-emitting diode device array properties

Cheng-Hao Gao1,2, Feng Xu2,3、*, Li Zhang2, De-Sheng Zhao2, Xing Wei2, Ling-Juan Che2, Yong-Zhang Zhuang2, Bao-Shun Zhang2、*, and Jing Zhang1、*
Author Affiliations
  • 1Institute of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 085202, China
  • 2Department of Physics, Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou 215123, China
  • 3Institute of Opto-Electronic, Nanjing University & Yangzhou, Yangzhou 225009, China
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    Figures & Tables(10)
    (a) Schematic structure of micro-LED array; (b) SEM image of 10 μm micro-LED array surface.(a) micro-LED阵列结构图; (b) 10 μm micro-LED阵列表面SEM图像
    (a) The I-V and (b) light output power density-current density characteristics of 6 μm arrays of samples A and B样品A和B 6 μm阵列的(a) I-V 特性和(b)光输出密度-电流密度特性
    Comparison of (a) reverse leakage current and (b) light output density between implanted isolated micro-LED devices and mesa etching devices.注入隔离micro-LED器件与台面刻蚀器件 (a)反向漏电流和(b)光输出密度比较
    The relationship between damage and implantation depth of F ion with different implantation energies with SRIM simulation.SRIM模拟F离子不同注入能量下产生的损伤与注入深度关系
    Schematic of CTLM test.CTLM测量原理图
    The CTLM linear fitting curve at (a) the implantation energy of 50 keV and (b) 50/100 keV.CTLM线性拟合曲线 (a) 50 keV能量注入; (b) 50/100 keV能量注入
    I-V characteristics of the different emission aperture arrays.不同发光孔径阵列I-V特性曲线
    Light-emitting aperture arrays of (a) 6 μm, (b) 8 μm, and (c)10 μm at 20 mA.20 mA下 (a) 6 μm, (b) 8 μm, (c) 10 μm发光孔径阵列发光图像
    • Table 1.

      The photoelectric properties of 6 μm micro-LED array.

      6 μm micro-LED阵列光电性能参数

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      Table 1.

      The photoelectric properties of 6 μm micro-LED array.

      6 μm micro-LED阵列光电性能参数

      样品工作电压(20 mA)/V反向漏电流(–5 V)/A光输出密度(2264 A/cm–2)/W·cm–2
      A3.692.89 × 10–731.34
      B3.273.43 × 10–840.59
    • Table 2.

      The actual emission condition of single light-emitting aperture in sample B.

      样品B单颗发光孔径实际发光情况

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      Table 2.

      The actual emission condition of single light-emitting aperture in sample B.

      样品B单颗发光孔径实际发光情况

      器件尺寸/μm681020[16]10[17]
      隔离方式注入台面刻蚀
      实际发光区域
      实际发光面积S1/μm224.1043.9272.0414470 ± 10
      器件面积 S2/μm228.2650.2478.50400100
      S1/S2/% 85%87%92%36%70 ± 10
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    Cheng-Hao Gao, Feng Xu, Li Zhang, De-Sheng Zhao, Xing Wei, Ling-Juan Che, Yong-Zhang Zhuang, Bao-Shun Zhang, Jing Zhang. Ion implantation isolation based micro-light-emitting diode device array properties[J]. Acta Physica Sinica, 2020, 69(2): 027802-1

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    Paper Information

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    Received: Sep. 18, 2019

    Accepted: --

    Published Online: Nov. 9, 2020

    The Author Email: Bao-Shun Zhang (bszhang2006@sinano.ac.cn), Jing Zhang (zhangjingcust@cust.edu.cn)

    DOI:10.7498/aps.69.20191418

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