Optical Instruments, Volume. 46, Issue 4, 29(2024)

Study on PQ/PMMA holographic recording characteristics and crumpling

Ruicheng JIANG, Yimian NI, Guangwei ZHANG, and Chunxian TAO*
Author Affiliations
  • School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology,Shanghai 200093, China
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    Figures & Tables(9)
    Schematic diagram of off-axis holographic storage optical path
    Schematic diagram of the crumpling test device
    Effect of sample thickness on diffraction efficiency
    Variation of diffraction efficiency with light intensity at different thicknesses
    The relation between diffraction peak value and light intensity
    Relation between interference angle and diffraction efficiency
    Angular selectivity curves with different parameters
    • Table 1. Relation between diffraction peak and spatial frequency

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      Table 1. Relation between diffraction peak and spatial frequency

      干涉夹角25°30°35°40°45°
      空间频率813 lp/mm973 lp/mm1130 lp/mm1285 lp/mm1438 lp/mm
      衍射峰值57.7%64.8%68.1%72.5%30.6%
    • Table 2. The amount of crumpling caused by different covariates

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      Table 2. The amount of crumpling caused by different covariates

      参量数值角度偏移皱缩率带宽
      厚度1 mm0.0250.17%0.20°
      1.5 mm0.0170.12%0.14°
      2 mm0.0110.07%0.13°
      记录光强20 mW/cm20.0220.15%0.13°
      25 mW/cm20.0140.097%0.13°
      30 mW/cm20.0080.055%0.13°
      空间频率973 lp/mm0.010.069%0.21°
      1130 lp/mm0.0130.079%0.16°
      1285 lp/mm0.0170.092%0.15°
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    Ruicheng JIANG, Yimian NI, Guangwei ZHANG, Chunxian TAO. Study on PQ/PMMA holographic recording characteristics and crumpling[J]. Optical Instruments, 2024, 46(4): 29

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    Paper Information

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    Received: Jul. 15, 2024

    Accepted: --

    Published Online: Nov. 14, 2024

    The Author Email: Chunxian TAO (tao@usst.edu.cn)

    DOI:10.3969/j.issn.1005-5630.202407150079

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