Chinese Journal of Quantum Electronics, Volume. 21, Issue 6, 873(2004)

Study on two wavelength fiber sensor for measuring surface roughness and its measuring error

[in Chinese]1、* and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(3)

    [3] [3] Henning H, Christof K. Soft X-ray scattering from rough surface: experimental and theoretical analysis [J]. Appl.Opt., 1987, 26(4): 2851-2859.

    [6] [6] Jin W, Stewart G, Culshaw B. Source noise limitation in an optical methane detection system using a broadband source [J]. Appl. Opt., 1995, 34(13): 2345-2349.

    [7] [7] Jin W, Stewart G, Philp W, et al. Limitation of absorption-based fibre optic gas sensors by coherent reflections [J]. Appl. Opt., 1997, 36(25): 6251-6255.

    CLP Journals

    [1] Zhu Nannan, Zhang Jun. Multi-wavelength fiber sensor for measuring surface roughness based on laser scattering[J]. Infrared and Laser Engineering, 2016, 45(5): 522003

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    [in Chinese], [in Chinese]. Study on two wavelength fiber sensor for measuring surface roughness and its measuring error[J]. Chinese Journal of Quantum Electronics, 2004, 21(6): 873

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    Paper Information

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    Received: Aug. 8, 2003

    Accepted: --

    Published Online: May. 15, 2006

    The Author Email: (fengmingkun@sohu.com)

    DOI:

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