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Spectroscopy and Spectral Analysis, Volume. 36, Issue 7, 2279(2016)

Research on M Dwarf Sub-Classification Based on the Measurement of Residual Distribution

KANG Chao1... PAN Jing-chang1, YI Zhen-ping1, WEI Peng2 and JIANG Bin1 |Show fewer author(s)
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    KANG Chao, PAN Jing-chang, YI Zhen-ping, WEI Peng, JIANG Bin. Research on M Dwarf Sub-Classification Based on the Measurement of Residual Distribution[J]. Spectroscopy and Spectral Analysis, 2016, 36(7): 2279

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    Paper Information

    Received: May. 18, 2015

    Accepted: --

    Published Online: Dec. 23, 2016

    The Author Email:

    DOI:10.3964/j.issn.1000-0593(2016)07-2279-05

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology