Matter and Radiation at Extremes, Volume. 5, Issue 3, 038401(2020)
Crystallography of low Z material at ultrahigh pressure: Case study on solid hydrogen
Fig. 1. Axial pressure distribution of a diamond anvil with a hydrogen sample at 228 GPa. (a) Raman spectra of the ambient diamond anvil measured with the laser beam in focus and out of focus at different distances. (b) Intensity of a diamond Raman phonon measured with the laser beam in focus and out of focus at different distances. The intensity drops to 50% at 40
Fig. 2. Examination of diamond anvils by synchrotron white beam topographic imaging. (a) Experimental setups at beamline 1-BM of the APS at ANL. The inset shows the sample and sample holder. (b) Developed X-ray film with the recorded Laue pattern. (c)–(f) show topographic (top) and optical microscopic (bottom) images of selected anvils. (c) Example of a cracked diamond anvil, released from 200 GPa, where the red dashed box on the topographic image marks the cracked position while the corresponding microscopic image shows the anvil after pressure release. (d)–(f) Anvils for ultrahigh-pressure hydrogen experiments, with the maximum pressures before failure being 210 GPa, 232 GPa, and 270 GPa, respectively.
Fig. 3. Correlation of the maximum pressures achieved on hydrogen samples with the final sizes of the sample chambers. The inset shows a microscope image of a diffusion-induced crack inside a diamond anvil with a hydrogen sample at megabar pressure. This figure summarizes some of our early experiments with W gaskets and 40 or 50
Fig. 4. (a) Schematic of the X-ray path of a sample in a DAC with a composite gasket. (b) Demonstration of the influences of the tail of a focused X-ray on XRD patterns from DAC samples. The inserts on the left and right show XRD patterns in the case of a composite gasket with an MgO insert and the case of a Re gasket, respectively.
Fig. 5. XRD contrast imaging of a hydrogen sample with a composite gasket. (a) Microscope image of the sample illustrated by both transmitted and reflected light. (b) Enlarged image of the part included in the red dashed box in (a). (c) Bragg peaks tracked in XDI software.
Fig. 6. (a) Microscope image of a typical H2–He sample with 40 or 50 i
Fig. 7. XRD of hydrogen using a 50 nm focused X-ray beam. (a) Selected XRD raw image showing the Bragg peak of hydrogen (red box). The saturating Bragg peaks (blue boxes) are from diamond. (b), (c), and (d) Cropped XRD images of a hydrogen Bragg peak and two types of non-sample peaks, respectively. The image in (b) was obtained from a Pilatus 1M detector with 172
Fig. 8. (a) Experimental setup with the 10° MCC and (b) example of an XRD image obtained with it. (c) Experimental setup with the 30° MCC and (d) example of an XRD image obtained with it. Experimental devices were pictured at 16IDB of APS, ANL. The green and red boxes in (c) and (d) mark the exposed areas on the Pilatus 1M detector from the MCCs and hydrogen Bragg peaks, respectively.
Fig. 9. Comparison of the SBR [hydrogen (100)] for different setups. Open and solid symbols represent data collected using MarCCD 165 and Pilatus 1M detectors, respectively. Circles represent H2–He samples measured using a 6 × 7
Fig. 10. (a) Comparison between the
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Cheng Ji, Bing Li, Wenjun Liu, Jesse S. Smith, Alexander Björling, Arnab Majumdar, Wei Luo, Rajeev Ahuja, Jinfu Shu, Junyue Wang, Stanislav Sinogeikin, Yue Meng, Vitali B. Prakapenka, Eran Greenberg, Ruqing Xu, Xianrong Huang, Yang Ding, Alexander Soldatov, Wenge Yang, Guoyin Shen, Wendy L. Mao, Ho-Kwang Mao. Crystallography of low Z material at ultrahigh pressure: Case study on solid hydrogen[J]. Matter and Radiation at Extremes, 2020, 5(3): 038401
Category: High Pressure Physics and Materials Science
Received: Jan. 31, 2020
Accepted: Mar. 15, 2020
Published Online: Nov. 25, 2020
The Author Email: Mao Ho-Kwang (maohk@hpstar.ac.cn)