Laser & Optoelectronics Progress, Volume. 58, Issue 19, 1912003(2021)

Temperature Compensation Model for Large-Aperture Optoelectronic Devices

Qian Liang1,2,3、** and Yahui Zhang1,2,3、*
Author Affiliations
  • 1Key Laboratory of Beam Control, Chinese Academy of Sciences, Chengdu , Sichuan 610209, China
  • 2Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu Sichuan 610209, China
  • 3University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(8)
    Simulation results of focal length changes of different spectral bands with temperature
    Relationship between temperature and focal length. (a) Linear-convex curve model; (b) convex curve-linear model; (c) convex curve-concave curve(or linear)-concave curve model; (d) convex curve model; (e) concave curve-convex curve(or linear)-convex curve model; (f) convex curve model
    Relationship between the temperature and the change of the Cassegrain focus for the 1 m telescope
    Simulation result of linear compensation model
    Simulation results of Fourier compensation model. (a) Simulation result of the first-order Fourier compensation model; (b) simulation result of the second-order Fourier compensation model; (c) simulation result of the third-order Fourier compensation model
    Experimental simulation results. (a) Fitting result (up) and residual(down) of linear compensation model; (b) fitting result(up) and residual(down) of Fourier compensation model
    Residual comparison of two compensation models
    • Table 1. Statistical analysis of long focus FLC for visible light with temperature

      View table

      Table 1. Statistical analysis of long focus FLC for visible light with temperature

      Temperature /℃FLC /mmTemperature /℃FLC /mmTemperature /℃FLC /mm
      -3041.217-513.137200
      -2537.005010.32925-3.711
      -2035.13355.64930-6.987
      -1524.369102.473
      -1018.81150.969
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    Qian Liang, Yahui Zhang. Temperature Compensation Model for Large-Aperture Optoelectronic Devices[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1912003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 27, 2020

    Accepted: Mar. 2, 2021

    Published Online: Oct. 28, 2021

    The Author Email: Liang Qian (liangqian18@mails.ucas.ac.cn), Zhang Yahui (zharvey@ioe.ac.cn)

    DOI:10.3788/LOP202158.1912003

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