Electro-Optic Technology Application, Volume. 26, Issue 6, 14(2011)
Far-field Simulation and Analysis on Laser Irradiation of Electro-optical Detection System
[1] [1] F Bartoli. Irreversible damage in IR detector materials[J].Appl. Opt, 1977, 16: 2934.
[2] [2] F Bartoli. Ageneralize in thermal model for laser damage ininfrared detectors[J]. J Appl.Phys,1976,47.2875.
[3] [3] R H Dyck,W Steffe.Effects of optical crosstalk in CCD im.age sensors[C]// in Proc. 5th Int. Conf on Applications ofCharge-CouPled Devices. San Diego,CA,1978: 55-61.
[4] [4] James p Lavine,Win-chyi Chang,Constantine N Anagnosto.poulos. Monte-Carlo Simulation of the Photoelectron Cross.talk in Silicon Imaging Devices[C]// IEEE Transactions onComputer-aided Design. CAD-4(4),1985:531-535.
Get Citation
Copy Citation Text
ZHANG Yong-mei, ZHANG Jian-xin. Far-field Simulation and Analysis on Laser Irradiation of Electro-optical Detection System[J]. Electro-Optic Technology Application, 2011, 26(6): 14
Category:
Received: Dec. 14, 2011
Accepted: --
Published Online: Jan. 11, 2012
The Author Email: