Electro-Optic Technology Application, Volume. 26, Issue 6, 14(2011)

Far-field Simulation and Analysis on Laser Irradiation of Electro-optical Detection System

ZHANG Yong-mei and ZHANG Jian-xin
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    References(4)

    [1] [1] F Bartoli. Irreversible damage in IR detector materials[J].Appl. Opt, 1977, 16: 2934.

    [2] [2] F Bartoli. Ageneralize in thermal model for laser damage ininfrared detectors[J]. J Appl.Phys,1976,47.2875.

    [3] [3] R H Dyck,W Steffe.Effects of optical crosstalk in CCD im.age sensors[C]// in Proc. 5th Int. Conf on Applications ofCharge-CouPled Devices. San Diego,CA,1978: 55-61.

    [4] [4] James p Lavine,Win-chyi Chang,Constantine N Anagnosto.poulos. Monte-Carlo Simulation of the Photoelectron Cross.talk in Silicon Imaging Devices[C]// IEEE Transactions onComputer-aided Design. CAD-4(4),1985:531-535.

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    ZHANG Yong-mei, ZHANG Jian-xin. Far-field Simulation and Analysis on Laser Irradiation of Electro-optical Detection System[J]. Electro-Optic Technology Application, 2011, 26(6): 14

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    Paper Information

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    Received: Dec. 14, 2011

    Accepted: --

    Published Online: Jan. 11, 2012

    The Author Email:

    DOI:1673-1255(2011)06-0014-04

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