Acta Optica Sinica, Volume. 15, Issue 4, 492(1995)

New Design of Angle-Variable Spectroscopic Ellipsometer (RPA type)

[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [2] Zhang Rongjun, Lu Weijie, Cai Qingyuan, Yu Xiang, Zhou Weixi, Zheng Yuxiang, Chen Liangyao. Study on Ellipsometric Spectra of Silicon Nanocrystals[J]. Acta Optica Sinica, 2010, 30(7): 1891

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New Design of Angle-Variable Spectroscopic Ellipsometer (RPA type)[J]. Acta Optica Sinica, 1995, 15(4): 492

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 8, 1993

    Accepted: --

    Published Online: Aug. 17, 2007

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