Acta Photonica Sinica, Volume. 39, Issue 11, 2031(2010)

Length Measurement of Whole Field Based on Spatial Carrier Frequency Interferometry

WANG Xiaopeng1...2,*, ZHU Rihong1, SU Junhong3 and CHEN Lei1 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    References(8)

    [1] [1] MASSIG J H,HEPPNER J.Fringe pattern analysis with high accuracy by use of the Fourier transform method:theory and experimental tests[J].Appl Opt,2001,40(13):20812088.

    [2] [2] KARAALIOGLU C,SKARLATOS Y.Measurement of thin film thickness by electronic speckle pattern interferometry [J].Opt Commun,2004,(234):269276.

    [3] [3] GE Aiming,CHEN Jinbang,CHEN Lei,et al.Automatic interference fringes processing in absolute measurement of central length of gauge block[J].Journal of Nanjing University of Science and Technology,2000,24(3):228231.

    [4] [4] CHEN Jinjun.Study on interference testing by FFT method[D].Nanjing: Nanjing University of Science and Technology,2004.

    [5] [5] SHUAI Gaolong,SU Junhong,YANG Lihong,et al.Interferometric measurement method of thin film thickness based on FFT[C].SPIE,2008:7283:2k12k5.

    [6] [6] HUANG Jing,ZHU Rihong,CHEN Lei.Interferogram spreading method based on exemplar matching[J].Acta Optica Sinica,2007,27(7):12171223.

    [7] [7] SU Junhong.Interferogram region spreading technology in spatial domain[J].Infrared and Laser Engineering,2005,34(4):397400.

    [8] [8] YU Liang,SU Xianyu.Phase unwrapping algorithm based on relative distance guidance[J].Acta Photonica Sinica,2009,38(5):12351239.

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    WANG Xiaopeng, ZHU Rihong, SU Junhong, CHEN Lei. Length Measurement of Whole Field Based on Spatial Carrier Frequency Interferometry[J]. Acta Photonica Sinica, 2010, 39(11): 2031

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    Paper Information

    Received: Apr. 1, 2010

    Accepted: --

    Published Online: Dec. 7, 2010

    The Author Email: Xiaopeng WANG (wangxiaopeng205@sina.com)

    DOI:

    CSTR:32186.14.

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