Acta Photonica Sinica, Volume. 39, Issue 11, 2031(2010)
Length Measurement of Whole Field Based on Spatial Carrier Frequency Interferometry
[1] [1] MASSIG J H,HEPPNER J.Fringe pattern analysis with high accuracy by use of the Fourier transform method:theory and experimental tests[J].Appl Opt,2001,40(13):20812088.
[2] [2] KARAALIOGLU C,SKARLATOS Y.Measurement of thin film thickness by electronic speckle pattern interferometry [J].Opt Commun,2004,(234):269276.
[3] [3] GE Aiming,CHEN Jinbang,CHEN Lei,et al.Automatic interference fringes processing in absolute measurement of central length of gauge block[J].Journal of Nanjing University of Science and Technology,2000,24(3):228231.
[4] [4] CHEN Jinjun.Study on interference testing by FFT method[D].Nanjing: Nanjing University of Science and Technology,2004.
[5] [5] SHUAI Gaolong,SU Junhong,YANG Lihong,et al.Interferometric measurement method of thin film thickness based on FFT[C].SPIE,2008:7283:2k12k5.
[6] [6] HUANG Jing,ZHU Rihong,CHEN Lei.Interferogram spreading method based on exemplar matching[J].Acta Optica Sinica,2007,27(7):12171223.
[7] [7] SU Junhong.Interferogram region spreading technology in spatial domain[J].Infrared and Laser Engineering,2005,34(4):397400.
[8] [8] YU Liang,SU Xianyu.Phase unwrapping algorithm based on relative distance guidance[J].Acta Photonica Sinica,2009,38(5):12351239.
Get Citation
Copy Citation Text
WANG Xiaopeng, ZHU Rihong, SU Junhong, CHEN Lei. Length Measurement of Whole Field Based on Spatial Carrier Frequency Interferometry[J]. Acta Photonica Sinica, 2010, 39(11): 2031
Received: Apr. 1, 2010
Accepted: --
Published Online: Dec. 7, 2010
The Author Email: Xiaopeng WANG (wangxiaopeng205@sina.com)
CSTR:32186.14.