Electro-Optic Technology Application, Volume. 32, Issue 4, 26(2017)

Experimental Research on Responsivity of CCD to Femto-second Laser and Continuous Wave Laser

GUAN Shang-hong and Si Han-ying
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  • [in Chinese]
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    References(2)

    [2] [2] Li F M,Nixon O, Nathan A. Degradation behavior and damage mechanisms of CCD image sensor with deep-UV laser radiation [J]. IEEE Trans on Electron Devices, 2004, 51(12): 2229-2236.

    [8] [8] Gamaly E G, Rode A V, Luther-Davis B.Ablation of solids by femto-second lasers I ablation mechanism and ablation thresholds for metals and dielectrics[J]. Physics of Plasma, 2002, 9(3): 949-957.

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    GUAN Shang-hong, Si Han-ying. Experimental Research on Responsivity of CCD to Femto-second Laser and Continuous Wave Laser[J]. Electro-Optic Technology Application, 2017, 32(4): 26

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    Paper Information

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    Received: Jun. 14, 2017

    Accepted: --

    Published Online: Oct. 30, 2017

    The Author Email:

    DOI:

    CSTR:32186.14.

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