Laser & Optoelectronics Progress, Volume. 52, Issue 7, 71604(2015)

Analysis of PID Effect for Polycrystalline Silicon Solar Cells Module

Ma Xinjian*
Author Affiliations
  • [in Chinese]
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    References(15)

    [1] [1] A R Hoffman, R G Ross Jr. Environmental qualification testing of terrestrial solar cell modules[C]. 13th IEEE PVSC, 1978: 835-842.

    [2] [2] R Swanson, M Cudzinovic, D Deceuster, et al.. The surface polarization effect in high-efficiency silicon solar cells[C]. 15th PVSC, 2005: 21-25.

    [3] [3] N G Dhere, V V Hadagali, S M Bet. Leakage currents pathways, magnitudes and their correlation to humidity and temperature in high voltage biased thin film PV modules[C]. 19th EUPVSEC, 2004: 2170-2173.

    [4] [4] N G Dhere, S M Bet, H P Patil. High-voltage bias testing of thin-film PV modules[C]. 3rd World Conference on Photovoltaic Energy Conversion, 2003, 2: 1923-1926.

    [5] [5] N G Dhere, M B Pandit. Study of delamination in acceleration tested PV modules[C]. 17th European Photovoltaic Solar Energy Conference, 2005: 572-575.

    [6] [6] Peter Hacke, Kent Terwilliger, Ryan Smith, et al.. System voltage potential-induced degradation mechanisms in PV modules and methods for test[C]. 37th IEEE PVSC, 2011: 1-7.

    [7] [7] P Hacke, M Kempe, K Terwilliger, et al.. Characterization of multicrystalline silicon modules with system bias voltage applied in damp heat[C]. 25th EUPVSEC, 2010: 3760-3765.

    [8] [8] Berghold J, Frank O, Hoehne H, et al.. Potential induced degradation of solar cells and panels[C]. 25th EUPVSEC, 2010: 3753-3759.

    [9] [9] Volker Naumann, Dominik Lausch, Stephan Grober, et al.. Microstructural analysis of crystal defects leading to potential-induced degradation (PID) of Si solar cells[J]. Energy Procedia, 2013, 33: 76-83.

    [10] [10] Volker Naumann, Dominik Lausch, Andreas Graff, et al.. The role of stacking faults for the formation of shunts during potential-induced degradation of crystalline Si solar cells[J]. Phys Status Solidi RRL, 2013, 7(5): 315-318.

    [14] [14] Simon Koch, Christian Seidel, Paul Grunow, et al.. Polarization effects and tests for crystalline silicon cells[C]. 26th EUPVSEC, 2011: 1726-1731.

    [16] [16] Wang Xuemeng, Ye Zirui, Shen Hui, et al.. Defect detection and classification evaluation system for crystalline silicon solar cells[J]. Laser & Optoelectronics Progress, 2013, 50(3): 031602.

    [17] [17] Ma Xinjian, Lin Tao. Analysis of mono-crystalline silicon solar cells electroluminescence defects and process influencing factors[J]. Laser & Optoelectronics Progress, 2013, 50(3): 031601.

    [19] [19] Li Feng, Yang Ying, Li Bishan, et al.. Research on the effect and stability of sulfur-passivated Si(100) surface[J]. Journal of Synthetic Crystals, 2014, 43(7): 1657-1661.

    [20] [20] Fan Jinxing, Shi Zhengrong, Zhang Chunguang, et al.. Influence of double-layer SiNx thin film deposited by PECVD on cell[J]. Advanced Semiconductor Manufacturing Technologies, 2012, 37(3): 192-196.

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    Ma Xinjian. Analysis of PID Effect for Polycrystalline Silicon Solar Cells Module[J]. Laser & Optoelectronics Progress, 2015, 52(7): 71604

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    Paper Information

    Category: Materials

    Received: Dec. 15, 2014

    Accepted: --

    Published Online: Jun. 26, 2015

    The Author Email: Xinjian Ma (932594765@qq.com)

    DOI:10.3788/lop52.071604

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