Optics and Precision Engineering, Volume. 25, Issue 10, 2676(2017)
Degradation mechanism for photon transfer curve of CMOS image sensor after irradiation
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FENG Jie, LI Yu-dong, WEN Lin, ZHOU Dong, MA Lin-dong. Degradation mechanism for photon transfer curve of CMOS image sensor after irradiation[J]. Optics and Precision Engineering, 2017, 25(10): 2676
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Received: Jun. 2, 2017
Accepted: --
Published Online: Nov. 24, 2017
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