Acta Optica Sinica, Volume. 40, Issue 15, 1523002(2020)
Study on γ-Ray Irradiation Damage Mode and Characterization of CMOS APS Camera
Fig. 1. Schematic diagram of sensor Bayer array
Fig. 2. Schematic of experimental system
Fig. 3. Radiation damage of dark and color image
Fig. 4. Distribution of dark current noise in dark image
Fig. 5. Scatter diagram of radiation life of main board and sensor board
Fig. 6. Gray scale stripe of video test card before and after irradiation. (a) Before irradiation; (b) 50 Gy; (c) 101 Gy; (d) 154 Gy
Fig. 7. Logic block diagram of fixed image denoising algorithm
Fig. 8. Grid images of pixel values for each channel of the frame image before and after noise reduction. (a) Color grid image before noise reduction; (b) color grid image after noise reduction; (c) gray scale stripe before noise reduction; (d) gray scale stripe after noise reduction
Fig. 9. Relationship between pixel value and total ionizing dose for gray scale stripe image. (a) Gray value; (b) red pixel; (c) green pixel; (d) blue pixel
Fig. 10. Scatterplot of color image pixel value with total dose
Fig. 11. Scatterplot of the average pixel value for each gray channel after correction with the total dose
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Shoulong Xu, Kuicheng Lin, Yongchao Han, Shuliang Zou, Xiuwu Yu, Qifan Wu, Yantao Qu, Hongtao Quan, Zengyan Li. Study on γ-Ray Irradiation Damage Mode and Characterization of CMOS APS Camera[J]. Acta Optica Sinica, 2020, 40(15): 1523002
Category: Optical Devices
Received: Mar. 12, 2020
Accepted: May. 6, 2020
Published Online: Aug. 14, 2020
The Author Email: Xu Shoulong (xusl@usc.edu.cn), Han Yongchao (hanyongchao@ciae.ac.cn), Zou Shuliang (zousl2013@126.com)