Laser & Optoelectronics Progress, Volume. 56, Issue 1, 011004(2019)
Subsurface Defects in Fused Silica Elements Detected by Fluorescence Imaging Technology
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Honglu Li, Hongjie Liu, Xiaodong Jiang, Jin Huang, Linhong Cao. Subsurface Defects in Fused Silica Elements Detected by Fluorescence Imaging Technology[J]. Laser & Optoelectronics Progress, 2019, 56(1): 011004
Category: Image Processing
Received: Jun. 21, 2018
Accepted: Jul. 18, 2018
Published Online: Aug. 1, 2019
The Author Email: Jiang Xiaodong (jiangxiaodong@163.com), Cao Linhong (hyclh@yeah.net)