Infrared and Laser Engineering, Volume. 33, Issue 2, 201(2004)

Analysis and implementation on canted slit-method for the test of MTF of infrared imaging systems

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Analysis and implementation on canted slit-method for the test of MTF of infrared imaging systems[J]. Infrared and Laser Engineering, 2004, 33(2): 201

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    Paper Information

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    Received: May. 9, 2003

    Accepted: Sep. 18, 2003

    Published Online: May. 25, 2006

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