[2] [2] PETR H.White-light spectral interferometry with the uncompensated Michelson interferometer and the group refractive index dispersion in fused silica[J].Opt Commun,2001,193:1-7.

[3] [3] DIDDANS S,DIELS J C.Dispersion measurements with white light interferometry[J].J Opt Soc Am (B),1996,13 (6):1120-1129.

[4] [4] SORIN W V,GRAY D F.Simultaneous thickness and group index measurement using optical low coherence reflectometry[J].IEEE Photon Technol Lett,1992,4(1):105-107.

[5] [5] KASAYA K,YOSHIKANI Y,ISHII H.Measurements of a semiconductor waveguide using a low-coherence interferometric reflectometer[J].IEEE Photon Technol Lett,1996,8(2):251-253.

[9] [9] LI Tian-chun,WANG An-bo,MURPHY K,et al.White-light scanning fiber Michelson interferometer for absolute positiondistance measurement[J].Opt Let,1995,20(7):785-787.