Optoelectronics Letters, Volume. 17, Issue 4, 231(2021)

Noncontact 3D measurement method on hole-structure precision inspection

Hao-tian SHI1... Di WU1, Cheng-kai PANG1, Hai-yan HUANG1, Xuan ZHANG2, Yan XU2, Xiu-liang CHEN1,* and Guang WU1 |Show fewer author(s)
Author Affiliations
  • 1State Key Laboratory of Precision Spectroscopy, East China Normal University, Shanghai 200241, China
  • 2AECC Commercial Aircraft Engine Co., Ltd., Shanghai 200241, China
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    SHI Hao-tian, WU Di, PANG Cheng-kai, HUANG Hai-yan, ZHANG Xuan, XU Yan, CHEN Xiu-liang, WU Guang. Noncontact 3D measurement method on hole-structure precision inspection[J]. Optoelectronics Letters, 2021, 17(4): 231

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    Paper Information

    Received: May. 19, 2020

    Accepted: Jul. 22, 2020

    Published Online: Sep. 2, 2021

    The Author Email: Xiu-liang CHEN (xlchen@phy.ecnu.edu.cn)

    DOI:10.1007/s11801-021-0084-8

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