[1] [1] Y. J. Rao, D. A. Jackson. Recent progress in fibre optic low-coherence interferometry［J］. Meas. Sci. Technol., 1996, 7(7): 981～999

[2] [2] S. S. C. Chim, G. S. Kino. Three-dimensional image realization in interference microscopy［J］. Appl. Opt., 1992, 31(14): 2550～2553

[3] [3] B. L. Danielson, C. Y. Boisrobert. Absolute optical ranging using low coherence interferometry［J］. Appl. Opt., 1991, 30(21): 2975～2979

[4] [4] K. Kasaya, Y. Yoshikani, H. Ishii. Measurements of a semiconductor waveguide using a low-coherence interferometric reflectometer［J］. IEEE Photon. Technol. Lett., 1996, 8(2): 251～253

[5] [5] W. V. Sorin, D. F. Gray. Simultaneous thickness and group index measurement using optical low-coherence reflectometry［J］. IEEE Photon. Technol. Lett., 1992, 4(1): 105～107

[6] [6] S. Diddams, J. C. Diels. Dispersion measurements with white-light interferometry［J］. J. Opt. Soc. Am. B, 1996, 13(6): 1120～1129

[7] [7] Li Maohe, Zhang Meidun. Refractive index measurement by optical fiber Michelson interferometer［J］. Acta Optica Sinica, 2000, 20(9): 1294～1296

[8] [8] Zhang Chengping, Li Tianchu, Wang Minming et al.. Measurement of group refractive index of fibers using semi-coherent interference［J］. Optical Technique, 2000, 26(2): 153～155

[9] [9] Yang Tianbo, Guo Hong, Li Dacheng. The summary of algorithms for white-light scanning interferometry［J］. Optical Technique, 2006, 32(1): 115～117

[10] [10] K. G. Larkin. Efficient nonlinear algorithm for envelope detection in white light interferometry ［J］. J. Opt. Soc. Am. A, 1996, 13(4): 832～843

[11] [11] P. Sandoz, R. Peoiller, A. Plata. Unambiguous profilometry by fringe order identification in white-light phase-shifting interferometry［J］. J. Mod. Opt., 1997, 44(3): 519～534

[12] [12] R. J. Recknagel, G. Notni. Analysis of white light interferograms using wavelet methods［J］. Opt. Commun., 1998, 148(1-3): 122～128

[13] [13] P. de Groot, L. Deck. Surface profiling by analysis of white-light interferograms in the spatial frequency domain［J］. J. Mod. Opt., 1995, 42(2): 389～401

[14] [14] P. de Groot, X.-C. de Lega, J. Kramer et al.. Determination of fringe order in white-light interference microscopy［J］. Appl. Opt., 2002, 41(22): 4571～4578

[15] [15] Zhang Jinghua, Wang Chunhua. Affect of power spectrum of source on white-light interference measurement［J］. Optical Technique, 1997, 23(5): 30～32

[16] [16] Huangfu Guoqing. Effect of dispersion and visual function on refractive index measurement by using white-light interference［J］. Acta Optica Sinica, 2010, 30(1): 117～122

[17] [17] Cheng Lu. Principle of Optics and Development［M］. Beijing: Science Press, 1990. 380～391

[18] [18] Li Jianlin. The Set of Analytic Solution on Function of Complex Variable and Integral Transform (2th Ed)［M］. Xi′an: Northwestern Polytechnical University Press, 1986. 126

[19] [19] Gong Zutong, Li Jingzhen. Handbook of Optics ［M］. Xi′an: Publishing House of Science and Technology of Shannxi, 1986. 1355

[20] [20] M. Born, E. Wolf. Principles of Optics (7th Ed)［M］. Yang Jiasun et al. Transl. Beijing: Publishing House of Electronics Industry, 2005. 249