Infrared and Laser Engineering, Volume. 46, Issue 4, 427001(2017)

3D scanning measurement system based on double-line projection and the line-plane constraint

Wang Peng, Shi Ruize, Zhong Xiaofeng, and Sun Changku
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    Wang Peng, Shi Ruize, Zhong Xiaofeng, Sun Changku. 3D scanning measurement system based on double-line projection and the line-plane constraint[J]. Infrared and Laser Engineering, 2017, 46(4): 427001

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    Paper Information

    Category: 视觉深度学习

    Received: Aug. 5, 2016

    Accepted: Sep. 15, 2016

    Published Online: Jun. 30, 2017

    The Author Email:

    DOI:10.3788/irla201746.0427001

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