Infrared and Laser Engineering, Volume. 46, Issue 4, 427001(2017)
3D scanning measurement system based on double-line projection and the line-plane constraint
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Wang Peng, Shi Ruize, Zhong Xiaofeng, Sun Changku. 3D scanning measurement system based on double-line projection and the line-plane constraint[J]. Infrared and Laser Engineering, 2017, 46(4): 427001
Paper Information
Category: 视觉深度学习
Received: Aug. 5, 2016
Accepted: Sep. 15, 2016
Published Online: Jun. 30, 2017
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