Infrared and Laser Engineering, Volume. 53, Issue 10, 20240319(2024)

Substrate material selection method for multilayer diffraction elements based on extended scalar diffraction theory

Zonglin LIANG1, Bo ZHANG1, Yuanming ZHAO2, Mingxu PIAO1, Yiyang DONG1, Yueling ZHANG3, and Shoufeng TONG1
Author Affiliations
  • 1Changchun University of Science and Technology The School of Electro-Optical Engineering, Changchun 130022, China
  • 2The 27th Research Institute of China Electronics Technology Group Corporation, Zhengzhou 450047, China
  • 3The 53th Research Institute of China Electronics Technology Group Corporation, Tianjin 300308, China
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    Figures & Tables(9)
    Analysis model of DOE
    The analysis model of ESDT
    PIDE of SD and ESDT
    ESDT PIDE with respect to angle under different period widths T
    3D relationship diagram of PIDE, incident angle, and period width for different base material combinations
    Diffraction efficiency difference obtained based on ESDT
    • Table 1. Diffraction efficiency difference obtained based on ESDT

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      Table 1. Diffraction efficiency difference obtained based on ESDT

      Substrate materialPeriod width/μm
      5006007008009001000
      ZNSE-ZNS20.2814.8811.9710.279.198.47
      AMTIR1-ZNS17.6313.7611.7610.619.889.38
      AMTIR1-ZNSE47.0043.8038.5235.4632.5229.52
      IRG26-ZNS37.5437.2036.7836.4336.1735.96
      IRG26-ZNSE44.7345.9745.7143.7246.3051.44
      GE-ZNS87.7290.2691.3091.8092.0992.27
    • Table 2. The angle range where PIDE ≥ 90%, in the context of the MWIR-LWIR dual band

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      Table 2. The angle range where PIDE ≥ 90%, in the context of the MWIR-LWIR dual band

      Substrate materialPeriod width/μm
      5006007008009001000
      ZNSE-ZNS−4.5-10.0−5.9-10.0−6.8-10.0−7.4-10.0−7.9-10.0−8.3-10.0
      ±4.5±5.9±6.8±7.4±7.9±8.3
      AMTIR1-ZNS−5.4-10.0−6.5-10.0−7.2-10.0−7.6-10.0−8.0-10.0−8.2-10.0
      ±5.4±6.5±7.2±7.6±8.0±8.2
      AMTIR1-ZNSE4.6-10.02-10.00.3-10.0−1-10.0−1.9-10.0−2.7-10.0
      ---±1.0±1.9±2.7
      IRG26-ZNS−3.1-9.9−3.9-9.1−4.4-8.6−4.8-8.3−5.0-8.0−5.2-7.9
      ±3.1±3.9±4.4±4.8±5.0±5.2
      IRG26-ZNSE4.6-9.42.8-10.01.6-10.00.9-9.80.3-9.0−0.2-8.4
      -----±0.2
      GE-ZNS−1.0-4.8−1.4-4.3−1.7-4.0−1.9-3.8−2.0-3.7−2.1-3.6
      ±1.0±1.4±1.7±1.9±2.0±2.1
    • Table 3. The angle range where PIDE ≥ 95%, in the context of the MWIR-LWIR dual band

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      Table 3. The angle range where PIDE ≥ 95%, in the context of the MWIR-LWIR dual band

      Substrate materialPeriod width/μm
      5006007008009001000
      ZNSE-ZNS−2.4-10.0−3.7-10.0−4.6-10.0−5.2-10.0−5.7-10.0−6.0-10.0
      ±2.4±3.7±4.6±5.2±5.7±6.0
      AMTIR1-ZNS−3.3-10.0−4.3-10.0−5.0-10.0−5.5-9.9−5.8-9.6−6.0-9.4
      ±3.3±4.3±5.0±5.5±5.8±6.0
      AMTIR1-ZNSE5.9-9.93.6-10.02.1-10.01.0-10.00.2-10.0−0.5-10.0
      -----±0.5
      IRG26-ZNS−1.5-8.3−2.3-7.5−2.8-7.0−3.1-6.7−3.4-6.4−3.6-6.2
      ±1.5±2.3±2.8±3.1±3.4±3.6
      IRG26-ZNSE------
      ------
      GE-ZNS0.8-2.90.5-2.40.2-2.10.1-1.80.0-1.7−0.1-1.6
      -----±0.1
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    Zonglin LIANG, Bo ZHANG, Yuanming ZHAO, Mingxu PIAO, Yiyang DONG, Yueling ZHANG, Shoufeng TONG. Substrate material selection method for multilayer diffraction elements based on extended scalar diffraction theory[J]. Infrared and Laser Engineering, 2024, 53(10): 20240319

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    Paper Information

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    Received: Jul. 15, 2024

    Accepted: --

    Published Online: Dec. 13, 2024

    The Author Email:

    DOI:10.3788/IRLA20240319

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