Anomalous transport of light at the phase transition to localization: strong dependence with incident angle

Ernesto Jimenez-Villar; M. C. S. Xavier; Niklaus U. Wetter; Valdeci Mestre; Weliton S. Martins; Gabriel F. Basso; V. A. Ermakov; F. C. Marques; Gilberto F. de Sá

doi:10.1364/PRJ.6.000929

Photonics Research, Volume. 6, Issue 10, 929(2018)

Anomalous transport of light at the phase transition to localization: strong dependence with incident angle

Ernesto Jimenez-Villar^1,2、*, M. C. S. Xavier^2,3, Niklaus U. Wetter¹, Valdeci Mestre⁴, Weliton S. Martins⁵, Gabriel F. Basso⁶, V. A. Ermakov⁷, F. C. Marques⁷, and Gilberto F. de Sá⁸

Author Affiliations

¹Instituto de Pesquisas Energéticas e Nucleares, CNEN_IPEN, São Paulo, SP 05508-000, Brazil

²Departamento de Física, Universidade Federal da Paraíba, João Pessoa, PB 58051-970, Brazil

³Departamento de Física, Universidade Estadual da Paraíba, Araruna, PB 58233-000, Brazil

⁴CCEA, Universidade Estadual da Paraíba, Patos, PB 58706-560, Brazil

⁵Departamento de Física, Universidade Federal Rural de Pernambuco, Recife, PE 52171-900, Brazil

⁶Departamento de Informática, Universidade Federal da Paraíba, Joao Pessoa, PB 58055-000, Brazil

⁷Departamento de Física Aplicada, Universidade Estadual de Campinas, Campinas, SP 13083-859, Brazil

⁸Química Fundamental, Universidade Federal de Pernambuco, Recife, PE 50670-901, Brazil

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Ernesto Jimenez-Villar, M. C. S. Xavier, Niklaus U. Wetter, Valdeci Mestre, Weliton S. Martins, Gabriel F. Basso, V. A. Ermakov, F. C. Marques, Gilberto F. de Sá. Anomalous transport of light at the phase transition to localization: strong dependence with incident angle[J]. Photonics Research, 2018, 6(10): 929

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Paper Information

Category: Materials

Received: Mar. 26, 2018

Accepted: Jun. 5, 2018

Published Online: Sep. 25, 2018

The Author Email: Ernesto Jimenez-Villar (Ernesto.Jimenez@uv.es)

DOI:10.1364/PRJ.6.000929

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology