[1] [1] N Papageorgiou, M Fichet, V Sautenkov, et al.. Doppler-free reflection spectroscopy of self-induced and krypton-induced collisional shift and broadening of cesium D2 line components in optically dense vapor[J]. Laser Phys, 1994, 4(2): 392-395.

[2] [2] O Rabi, A Amy-Klein, S Saltiel, et al.. Three-level nonlinear selective reflection at a dielectric/Cs vapor interface[J]. Europhys Lett, 1994, 25(8): 579-585.

[3] [3] T A Vartanyan, D Lin. Enhanced selective reflection from a thin layer of a dilute gaseous medium[J]. Phys Rev A, 1995, 51(3): 1959-1964.

[4] [4] M Chevrollier, M Oria, J de Souza, et al.. Selective reflection spectroscopy of a resonant vapor at the interface with a metallic layer[J]. Phys Rev E, 2001, 63(4): 046610.

[5] [5] I Hamdi, P Todorov, A Yarovitski, et al.. Laser spectroscopy with nanometric gas cells: distance dependence of atom-surface interaction and collisions under confinement[J]. Laser Phys, 2005, 15(7): 987-996.

[6] [6] Li Yuan-Yuan, Zhou Yu, Zhang Gui-Zhong. Selective reflection combined with Fabry-Perot effects from two-level atoms confined between two dielectric walls[J]. Chin Phys, 2006, 15(5): 985-991.

[7] [7] A Laliotis, I Maurin, M Fichet, et al.. Selective reflection spectroscopy at the interface between a calcium fluoride window and Cs vapor[J]. Appl Phys B, 2008, 90(3-4): 415-420.

[8] [8] Li Yuanyuan, Hou Xun, Bai Jintao, et al.. Two-photon dicke-narrowing selective reflection spectroscopy in thin atomic vapor[J]. Acta Optica Sinica, 2008, 28(8): 1623-1627

[9] [9] Li Gang, Zhao Jing, Li Jiaxing, et al.. Visible-infrared reflectance spectroscopy applied in rapid screen of diseases[J]. Acta Optica Sinica, 2011, 31(3): 0317001.

[10] [10] Y Li, L Li, Y Lu, et al.. Selective reflection of Airy beam at an interface between dielectric and homogeneous atomic medium[J]. Opt Express, 2013, 21 (7): 8311-8319.

[11] [11] Yu Kan, Huang Dexiu, Yin Juanjuan, et al.. Reflected-intensity distribution of a thin-film filter with oblique incidence of a Gaussian beam under-parallel case[J]. Chinese J Lasers, 2012, 39(8): 0807003

[12] [12] Guo Chun, Lin Dawei, Zhang Yundong, et al.. Determination of optical constants of LaF3 films from spectrophotometric measurements[J]. Acta Optica Sinica, 2011, 31(7): 0731001.

[13] [13] Zhou Jinzhao, Song Yajie, Zeng Xiangyou, et al.. Thin film parameters based on polarized light reflected from the multi-point measurement[J]. Chinese J Lasers, 2012, 39(12): 1207002.

[14] [14] Jiang Laixin, Lu Xinmiao, Wang Yang, et al.. Optical constants of antimony-bismuth alloy films[J]. Chinese J Lasers, 2012, 39(9): 0907001.

[15] [15] Zhong Zhicheng. Technological Optimization and Study on Nonlinear Optical Properties of KTa1-xNbxO3 Thin Film[D]. Wuhan: Huazhong University of Science and Technology, 2009.