Dressed selective reflection (DSR) spectra in a two-interface system of transparent-dielectric/metal (ferroelectric)-layer/confined-atoms are investigated . Three different films of KTa0.65Nb0.35O3, Ag and Fe are considered in our discussion. Symmetry dispersion DSR lines are shown for L/λ=0.25 and 0.75, where L is the thickness of the atomic vapor, and λ the wavelength of the probe field. This symmetry decreases with a combination of absorption and dispersion for L/λ=0.9, however, DSR lines almost disappear for L/λ=1. There is a slight decrease of the DSR amplitude when the thickness of KTa0.65Nb0.35O3 layer decreases. However, the DSR amplitude can be largely enhanced for metal layers, and this enhancement is the most manifest case when an ideal metal Ag layer is used. Electromagnetically induced reflection with high resolution (up to about 10 MHz) can be achieved due to the quantum interference of two dressed states and alternating current (ac) Strark splitting created by a coupling field. This high-resolution electromagnetically induced reflection dip can probably be used in the measurement of the optical parameters of surface layers, as well as the detection of optoelectronic devices in integrated optics.