Progress of High Spatiotemporal Resolution Terahertz Scanning Tunneling Microscope for Near-Field Imaging

Hongbo Li; Jingyin Xu; Wenyin Wei; En'en Li; Kai Zhang; Hong Li; Yirong Wu; Tianwu Wang; Guangyou Fang

doi:10.3788/LOP231383

Laser & Optoelectronics Progress, Volume. 60, Issue 18, 1811001(2023)

Progress of High Spatiotemporal Resolution Terahertz Scanning Tunneling Microscope for Near-Field Imaging

Hongbo Li^1,2,3,4,5, Jingyin Xu^4,5, Wenyin Wei^4,5, En'en Li^1,2,3,4,5, Kai Zhang^4,5, Hong Li^4,5, Yirong Wu^1,2,3,4,5, Tianwu Wang^{1,2,3,4,5、*}, and Guangyou Fang^{1,2,3,4,5、**}

Author Affiliations

¹Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100094, China

²Key Laboratory of Electromagnetic Radiation and Sensing Technology, Chinese Academy of Sciences, Beijing 100190, China

³School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China

⁴Greater Bay Area Branch of Aerospace Information Research Institute, Chinese Academy of Sciences, Guangzhou 510700, Guangdong, China

⁵Guangdong Provincial Key Laboratory of Terahertz Quantum Electromagnetics, Guangzhou 510700, Guangdong, China

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Hongbo Li, Jingyin Xu, Wenyin Wei, En'en Li, Kai Zhang, Hong Li, Yirong Wu, Tianwu Wang, Guangyou Fang. Progress of High Spatiotemporal Resolution Terahertz Scanning Tunneling Microscope for Near-Field Imaging[J]. Laser & Optoelectronics Progress, 2023, 60(18): 1811001

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Paper Information

Category: Imaging Systems

Received: May. 26, 2023

Accepted: Aug. 1, 2023

Published Online: Sep. 6, 2023

The Author Email: Wang Tianwu (wangtw@aircas.ac.cn), Fang Guangyou (gyfang@mail.ie.ac.cn)

DOI:10.3788/LOP231383

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology