Stochastic collocation for device-level variability analysis in integrated photonics

Yufei Xing; Domenico Spina; Ang Li; Tom Dhaene; Wim Bogaerts

doi:10.1364/prj.4.000093

Photonics Research, Volume. 4, Issue 2, 0093(2016)

Stochastic collocation for device-level variability analysis in integrated photonics

Yufei Xing¹, Domenico Spina², Ang Li¹, Tom Dhaene², and Wim Bogaerts^1,3、*

¹Photonics Research Group, Department of Information Technology, Center for Nano and Biophotonics, Ghent University imec, Ghent B-9000, Belgium

²Department of Information Technology, Internet Based Communication Networks and Services (IBCN), Ghent University iMinds, Gaston Crommenlaan 8 Bus 201, B-9050 Gent, Belgium

³Luceda Photonics, 9200 Dendermonde, Belgium

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Yufei Xing, Domenico Spina, Ang Li, Tom Dhaene, Wim Bogaerts, "Stochastic collocation for device-level variability analysis in integrated photonics," Photonics Res. 4, 0093 (2016)

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Paper Information

Received: Oct. 14, 2015

Accepted: Jan. 26, 2016

Published Online: Sep. 28, 2016

The Author Email: Wim Bogaerts (wim.bogaerts@ugent.be)

DOI:10.1364/prj.4.000093

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology