Electro-Optic Technology Application, Volume. 33, Issue 3, 1(2018)

Auto Focusing Technology Based on Infrared Image

WANG Jian-rui
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  • [in Chinese]
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    References(3)

    [4] [4] LI Bing, WANG Jian-lu, ZHANG Fei. Error analysis and compensation of single-beam laser triangulation measurement[C]//IEEE International Conference, 2009: 1223-1227.

    [9] [9] Fleetwood D M, Scofield J H. Evidence that similar point defectscause 1/f noise and radiation-induced-hole trapping in MOS transistors[J]. Phys Rev Lett, 1990, 64(5): 579-582.

    [10] [10] Vander Zier. Unified presentation of 1/f noise in electronic devices: fundamental 1/f noise sources[J]. IEEE, 1988, 76(3): 233-258.

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    WANG Jian-rui. Auto Focusing Technology Based on Infrared Image[J]. Electro-Optic Technology Application, 2018, 33(3): 1

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    Paper Information

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    Received: Mar. 18, 2018

    Accepted: --

    Published Online: Sep. 11, 2018

    The Author Email:

    DOI:

    CSTR:32186.14.

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