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Acta Optica Sinica, Volume. 35, Issue 6, 631002(2015)

Analysis of Amorphous Silicon Passivation Layer in Heterojunction Solar Cells by Spectroscopic Ellipsometry

Guo Wanwu1,2,3、*, Zhang Liping1, Bao Jian2, Meng Fanying1, Chen Yifeng2, Feng Zhiqiang2, and Liu Zhengxin1,3
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    Article index updated:May. 21, 2024

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    Guo Wanwu, Zhang Liping, Bao Jian, Meng Fanying, Chen Yifeng, Feng Zhiqiang, Liu Zhengxin. Analysis of Amorphous Silicon Passivation Layer in Heterojunction Solar Cells by Spectroscopic Ellipsometry[J]. Acta Optica Sinica, 2015, 35(6): 631002

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    Paper Information

    Category: Thin Films

    Received: Feb. 2, 2015

    Accepted: --

    Published Online: May. 28, 2015

    The Author Email: Wanwu Guo (wanwu.guo@trinasolar.com)

    DOI:10.3788/aos201535.0631002

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology