[1] [1] Cheng Xiang′ai, Lu Qisheng, Ma Liqin et al.. Experimental study of HgCdTe (PV) detector irradiated by CW 1.319 μm laser [J]. Acta Optica Sinica, 2003, 23(5): 622～626

[2] [2] Ma Liqin, Cheng Xiang′ai, Xu Xiaojun et al.. Chaos and its diagnosis in PV-type HgCdTe detector [J]. High Power Laser and Particle Beams, 2003, 15(1): 37～39

[3] [3] Li Xiuqian, Cheng Xiang′ai, Lu Qisheng et al.. The study on the response character of HgCdTe detectors under laser irradiation [J]. J. Academy of Equipment Command & Technology, 2004, 15(2): 113～116

[4] [4] Lu Qisheng, Jiang Zhiping, Liu Zejin et al.. The memory effect of PC type HgCdTe detectors [J]. J. Infrared and Millimeter Waves, 1998, 17(4): 317～320

[5] [5] Cai Hu. Investigation of High Intensity Pulsed TEA-CO2 Laser-Induced Damage on Hg0.8Cd0.2Te Wafer [D]. Wuhan: Huazhong University of Science and Technology, 2005. 15～89

[6] [6] C. S. Chen, A. H. Liu, G. Sun et al.. Analysis of laser damage threshold and morphological changes at the surface of a HgCdTe crystal［J］. J. Opt. A: Pure Appl. Opt., 2006, 8(1): 88～92

[7] [7] H. M. A. Schleijpen, A. Dimmeler, B. Eberle et al.. Laser dazzling of focal plane array cameras［C］. SPIE, 2007, 6543: 65431B

[8] [8] Wang Siwen, Li Yan, Guo Lihong et al.. Analysis on the disturbance of CO2 laser to long-wave infrared HgCdTe detector [J]. J. Infrared and Millimeter Waves, 2010, 29(2): 102～104

[9] [9] Fan Guangyu, Gong Haimei, Li Yanjin et al.. Temperature-cycling-reliability of IRFPA device [J]. Infrared and Laser Engineering, 2010, 39(4): 607～610

[10] [10] Hu Xiaoning, Zhang Haiyan, Li Yanjin et al.. Thermal stress analysis of HgCdTe focal plane arrays on Si substrates [J]. Laser & Infrared, 2006, 36(11): 1020～1022

[11] [11] Ren Yue, Hua Ping, Gong Rongzhou. Materials with low infrared emissivity based on epoxy resin [J]. Ordnance Material Science and Engineering, 2011, 34(2): 45～48

[12] [12] Sun Chengwei. The Effect of Laser Irradiation [M]. Beijing: National Defense Industry Press, 2002. 343～408

[13] [13] Chu Junhao. Narrow-Bandgap Semiconductor Physics [M]. Beijing: Science Press, 2005. 933～934

[14] [14] Li Li. Research on Semiconductor Detectors Irradiated by In-Band and Out-Band Laser Beams [D]. Changsha: National University of Defense Technology, 2010. 83～84

[15] [15] Jiang Zhiping, Liang Tianjiao, Lu Qisheng et al.. Heat effect calculations of PC type HgCdTe detectors when irradiated by laser [J]. Applied Laser, 1995, 15(4): 155～156